List of Selected Publications
( Last revised: 15 December 2009 )

Siranush E. BEZIRGANYAN , Ph.D.

		For more information see the web sites: http://www.bezirganyan.com/sira/ http://www.x-rom.org/

Manual for Students:     [1]. S.E. Bezirganyan. The method development of the topic: “Mechanics” of Practical Course of the Physics for Students. //University press, Department of Medical & Biological Physics, Informatics and Medical Equipment of the Yerevan State Medical University (YSMU) after Mkhitar Heratsi, Yerevan, Armenia, 200 printed copies, 1999 (in Russian).       Invention (Author) Certificates of Former Soviet Union:     [2]. P.H. Bezirganyan and S.E. Bezirganyan. Invention: “Roentgenographic Method of Investigation of the Single Crystals”. //Author Certificate № 1287714, date: 1.X.1986 (in Russian).       [3]. P.H. Bezirganyan, S.E. Bezirganyan, A.O. Aboyan and A.A. Khzardzhyan. Invention: “X-ray Interferometric Investigation Method of the Dilatation Imperfections of Single Crystals”. //Author Certificate № 1679313, date: 22.V.1991 (in Russian).       Ph.D. Thesis:     [4]. S.E. Bezirganyan. The Development of the Theory of X-ray Moire Patterns. //Ph.D. Thesis, University press, Chair of Solid State Physics, Yerevan State University, Yerevan, Armenia, 158 pp., 10th March 1987 (in Russian).       Main Publications:     [5]. P.H. Bezirganyan and S.E. Bezirganyan. Angular Magnification of Energy Fluxes of the X-ray Diffracted Waves in Crystals. //Izvest. Akad. Nauk Armyan. S.S.R. (Yerevan, Armenia), Ser. Fizika, v.18, issue 1, pp. 14-18, 1983 (in Russian).       [6]. H.P. Bezirganyan and S.E. Bezirganyan. X-radiation Intensity and Energy Flux Distributions inside the Crystal in Two-Mode Field Approximation. //Scientific Transactions of the Yerevan State University, "Fizika", v.2, pp. 48-55, 1983 (in Russian).       [7]. H.P. Bezirganyan and S.E. Bezirganyan. The Energy Distribution in the Two-Mode X-radiation Field inside the Perfect Crystals. //Crystal Res. & Technol., 1985, v.20, No.1, pp.53-60 (full text 2,96 MB).       [8]. P.H. Bezirganyan and S.E. Bezirganyan. New Mechanism of the Formation of X-ray Moire Patterns. //Scientific Transactions of the Yerevan State University, "Fizika", v.1, pp. 83-86, 1986 (in Russian).       [9]. P.H. Bezirganyan, V.G. Aslanyan and S.E. Bezirganyan. Interpretation of Interference Patterns Obtained from X-ray Laue Interferometers in Primary Plane Waves. Physica Status Solidi (a), v.110, issue 2, pp. 359-373, 1988.       [10]. H.P. Bezirganyan and S.E. Bezirganyan. The Intensity Distribution in the case of Diffraction of СоКа1 Radiation by the Germanium (620) lattice planes (Symmetrical Laue Case). Abstracts of IV All-Union Conference on Coherent Interaction of Radiation with Matter, p.84, Yurmala, Latvia, 17th-21st October 1988 (in Russian).   [11]. P.H. Bezirganyan, I.L. Eganyan and S.E. Bezirganyan. Two-crystal X-ray Interferometer with Thin Transparent Blocks. Abstracts of IV All-Union Conference on Coherent Interaction of Radiation with Matter, p.122, Yurmala, Latvia, 17th-21st October 1988 (in Russian).   [12]. P.H. Bezirganyan, H.P. Bezirganyan and S.E. Bezirganyan. X-ray Diffraction by a Dielectric with Cosine-like Polarizability (0 < θB ≤ π / 2; symmetrical Bragg case). //Proc. on XII European Crystallographic Meeting, v.3, p.30, Moscow, Russia, 20th-29th August 1989.   [13]. P.H. Bezirganyan, H.P. Bezirganyan and S.E. Bezirganyan. X-ray Diffraction by a Dielectric with Cosine-like Polarizability (0 < θB ≤ π / 2; symmetrical Bragg case). //Physica Status Solidi (a), v.116, issue 2, pp. 469-481, 1989.       [14]. H.P. Bezirganyan and S.E. Bezirganyan. The theory of x-ray dynamical diffraction by the layered periodical structures (0 < θB ≤ π / 2). //Abstracts of 3rd Conference on All-Union Inter-University Complex Programme "Röntgen", p.54, Chernovtsi, Ukraine, 15th-21st October 1989 (in Russian).   [15]. A.O. Aboyan, A.A. Khzardzhyan, P.H. Bezirganyan and S.E. Bezirganyan. X-ray Interferometric Pictures of Dislocations. Physica Status Solidi (a), v.118, issue 1, pp. 11-20, 1990.       [16]. A.O. Aboyan, P.H. Bezirganyan, S.E. Bezirganyan, A.M. Grigoryan and A.S. Tumasyan. Structural Imperfections of Crystals as a Result of Ion Implantation. Crystal Res. & Technol., v.25, No.12, pp. 1405-1418, 1990.       [17]. P.H. Bezirganyan and S.E. Bezirganyan. Generalization of the Signs of Formation of X-ray Moiré Patterns. Soviet Physics-Crystallography, v.36, issue 4, pp. 475-478, 1991 (Translated from Kristallografiya, v.36, No.4, pp. 83-86, 1991: in Russian).       [18]. P.H. Bezirganyan, S.E. Bezirganyan and A.O. Aboyan. Main Crystallographic Situations for the Formation of X-ray Moiré Patterns. Physica Status Solidi (a), v.126, issue 1, pp. 41-47, 1991.       [19]. H.P. Bezirganyan, S.E. Bezirganyan and P.H. Bezirganyan. The Extinction Length of the X-rays Diffracted by One-dimensional Modulated Structures. //The Book of Abstracts of 2nd European Symposium on X-ray Topography and High Resolution Diffraction (XTOP 1994), Berlin-Gösen, Germany, p. 77, 5th-7th September 1994 (see Abstract 284 KB).       [20]. S.E. Bezirganyan and H.P. Bezirganyan. X-ray Specular Standing Wave. //The Book of Abstracts of 2nd European Symposium on X-ray Topography and High Resolution Diffraction (XTOP 1994), Berlin-Gösen, Germany, p. 78, 5th-7th September 1994 (see Abstract 284 KB).       [21]. H.P. Bezirganyan and S.E. Bezirganyan. The Grazing Incidence Diffraction of X-rays with Wave Front Amplitude Periodically Varying along the Crystal Entrance Surface (Symmetrical Laue Case). //Proc. 2nd Conference of the Asian Crystallographic Association, (AsCA'95), Bangkok (Thailand), p. 1P07, 22nd-24th November, 1995; //Proc. 3rd European Symposium on X-ray Topography and High Resolution Diffraction, Palermo (Italy), p.139, 21st-24th April 1996.       [22]. H.P. Bezirganyan and S.E. Bezirganyan. Surface Diffracted Waves of Grazing Incident X-rays with the Periodically Modulated Amplitude. //Collected Abst. IUCr XVII Congress and General Assembly, Seattle, Washington (U.S.A.), p. 473, 8th-17th August 1996; //Acta Cryst. A52 Supplement (1996), Abstract PS12.03.11.       [23]. R.K. Karakhanyan, P.L. Aleksanyan and S.E. Bezirganyan. The Study of Brillouin Zones by Means of the Kikuchi Patterns. //Collected Abst. IUCr XVII Congress and General Assembly, Seattle, Washington (U.S.A.), PS 15.07.03, 8th-17th August 1996; //Acta Cryst. A52 Supplement (1996), Abstract PS 15.07.03.       [24]. R.K. Karakhanyan, P.L. Aleksanyan and S.E. Bezirganyan. Electron Energy Dependence of Kikuchi Lines Contrast, World of Microstructure, v.1, p.37, 1996.       [25]. H.P. Bezirganyan and S.E. Bezirganyan. X-ray Triple-Axis Diffractometry Using an Analyzer Crystal Acting in the Conditions of Grazing-Incidence Diffraction (GID). //6th Annual Conference Materials on Electron Microscopy-97, Yerevan (Armenia), p.52, September 1997.       [26]. R.K. Karakhanyan, P.L. Aleksanyan and S.E. Bezirganyan. The Effect of Diffracted Beams on the Contrast of Kikuchi Lines. //6th Annual Conference Materials on Electron Microscopy-97, Yerevan (Armenia), p.63, September 1997.       1998       [27]. H.P. Bezirganyan and S.E. Bezirganyan. Amplitude Diffraction Gratings Investigations by Grazing Incident X-rays Reflectometry. //Proc. 4th European Symposium on X-ray Topography and High Resolution Diffraction, Durham (England), P339, 9th-11th September 1998.       [28]. S.E. Bezirganyan and H.P. Bezirganyan. Surface Structure Investigation of Semiconductor Devices by Grazing-Incidence X-ray Diffraction (GIXD) and Standing-Wave Combined Techniques. //7th Annual Conference Proceedings on Electron Microscopy-1998, Yerevan (Armenia), p.15, 5th-7th October 1998.       [29]. R.K. Karakhanyan and S.E. Bezirganyan. The Intensification of the Kikuchi Lines of Surplusses by Prohibited Reflections. //7th Annual Conference Proceedings on Electron Microscopy-1998, Yerevan (Armenia), p.27, 5th-7th October 1998.       1999       [30]. R.K. Karakhanyan and S.E. Bezirganyan. Investigations of the Kikuchi Electrons Double Diffraction by the Electronograph. //Proc. 2nd National Conf. on Applications of the X-rays, Synchroton Radiation, Neutrons and Electrons for the Materials Investigations (RSNE99), ICr of Russian AS (Moscow), p.300, 23rd-27th May 1999 (in Russian).       [31]. P.H. Bezirganyan (Jr.), H.P. Bezirganyan, S.E. Bezirganyan and H.H. Bezirganyan (Jr.). The Standing Wave Formed by Grazing-Incidence X-rays in a Multilayer with Planes Normal to Surface. //Abstracts XVIII IUCr Congress and General Assembly, Glasgow (Scotland, UK), p.177, 4th-13th August 1999; //Acta Cryst. A55 Supplement (1999), Abstract P12.OE.001 ( 144KB).       [32]. R.K. Karakhanyan and S.E. Bezirganyan. Kikuchi Electron Double Diffraction. //Abstracts XVIII IUCr Congress and General Assembly, Glasgow (Scotland, UK), p.550, 4th-13th August 1999; //Acta Cryst. A55 Supplement (1999), Abstract P05.18.001 ( 144KB).       2000       [33]. P.H. Bezirganyan (Jr.), H.P. Bezirganyan, S.E. Bezirganyan and H.H. Bezirganyan (Jr.). Standing Wave Formed Close to Rectangular Surface Grating by the Grazing-Angle Incidence X-rays. //Abstracts of 19th European Crystallographic Meeting (ECM-19), Nancy, France, s4.m1.p5, 25th-31st August 2000; Acta Cryst. A56, Supplement (August 2000), s205. //Proc. 5th Biennial Conference on X-ray Topography and High Resolution Diffraction, Ustron-Jaszowiec (Poland), P2.58, p.186, 13th-15th September 2000.        [34]. P.H. Bezirganyan (Jr.), H.P. Bezirganyan, S.E. Bezirganyan and H.H. Bezirganyan (Jr.). The Grazing-Angle Incidence X-ray Diffraction (GIXD) by the Micro and Nano-Structures with Cosine-like Polarizability (Symmetrical Laue geometry if qB << p). //9th Annual Conference Proceedings on Electron Microscopy-2000, Yerevan (Armenia), pp.31,32, 17th-20th October 2000.       [35]. R.K. Karakhanyan and S.E. Bezirganyan. Kikuchi Electrons Double Diffraction in the Single Crystalline Films. //9th Annual Conference Proceedings on Electron Microscopy-2000, Yerevan (Armenia), pp.65-68, 17th-20th October 2000.       [36]. R.K. Karakhanyan and S.E. Bezirganyan. Temperature Dependence of Unindexed Kikuchi Lines. //9th Annual Conference Proceedings on Electron Microscopy-2000, Yerevan (Armenia), pp.69,70, 17th-20th October 2000.       2001       [37]. P.H. Bezirganyan (Jr.), H.P. Bezirganyan, S.E. Bezirganyan and H.H. Bezirganyan (Jr.). X-Ray Specular Backdiffraction from Thin Crystalline Layer Deposited on the Crystalline Substrate. //Abstracts of Materials Research Society (MRS) 2001 Spring Meeting, San Francisco, CA, R5.4, p.322, 16th-20th April 2001 (Abstracts of MRS 2001 - Symposium R: 223 KB).        [38]. P.H. Bezirganyan (Jr.), H.P. Bezirganyan, S.E. Bezirganyan and K.O. Hovnanyan. Grazing-Angle Incidence X-ray Diffraction Curves of Si1-xGex Thin Layer if the Composition Coefficient (x) is Varying Harmonically Along the Flat Layer Surface. //Book of Abstracts of 16th International Conference on X-Ray Optics and Microanalysis (ICXOM XVI), Vienna (Austria), p.57, 2nd-6th July 2001.        [39]. P.H. Bezirganyan (Jr.), H.P. Bezirganyan, S.E. Bezirganyan and H.H. Bezirganyan (Jr.). X-ray Specular Backdiffraction from Crystalline Substrate with Thin Amorphous Surface Layer. //10th Annual Conference Proceedings on Electron Microscopy-2001, Yerevan (Armenia), pp.35-37, 23rd-26th October 2001.        2002       [40]. H.H. Bezirganyan (Jr.), S.E. Bezirganyan, H.P. Bezirganyan and P.H. Bezirganyan (Jr.). Grazing-Angle Incidence X-ray Diffraction by the Si1-a(x)-b(x)Gea(x)Cb(x)/Si Heterojunction where the Germanium and the Carbon Concentrations are Periodically Varying along the Flat Layer Surface. //Abstracts of Materials Research Society (MRS) 2002 Spring Meeting, San Francisco, CA, B4.31, p.55, 1 st-5 th April 2002. //In Silicon Materials - Processing, Characterization, and Reliability, edited by Veteran J., O'Meara D.L., Misra V., Ho P., Mater. Res. Soc. Symp. Proc., v.716, San Francisco, CA, 2002, pp. 239-246.        [41]. S.E. Bezirganyan, H.P. Bezirganyan, H.H. Bezirganyan (Jr.) and P.H. Bezirganyan (Jr.). X-ray Diffraction by Heterojunction when Surface Layer Polarizability has a Parabolic Distribution. //Abstracts of American Crystallographic Association (ACA) 2002 Annual Meeting, San Antonio, Texas (USA), P128 (E0022), p.128, 25 th-30 th May 2002.        [42]. H.P. Bezirganyan, S.E. Bezirganyan, H.H. Bezirganyan (Jr.) and P.H. Bezirganyan (Jr.). Investigation of Si1-a-b Gea Cb / Si Strain-Compensated Heterojunction by the X-rays Backdiffraction Method.//Book of Abstracts of EDXRS 2002 Conference, Berlin (Germany), p.16, 16 th-21 st June 2002.        [43]. H.P. Bezirganyan, S.E. Bezirganyan, H.H. Bezirganyan (Jr.) and P.H. Bezirganyan (Jr.). The Vacuum Standing - Wave with Nodes Formed Parallel to X - ray Entrance Surface of the Si1-a-b Gea Cb / Si Strain-Compensated Heterojunction. //Book of Abstracts of the 9 th Conference on Total Reflection X-Ray Fluorescence Analysis (TXRF) and Related Methods, University of Madeira, Funchal, Madeira (Portugal), P-20, p. 67, 8 th-13 th September 2002.        [44]. H.P. Bezirganyan, S.E. Bezirganyan, H.H. Bezirganyan (Jr.) and P.H. Bezirganyan (Jr.). Backdiffraction Configuration for X-ray Standing Wave Formed just above the Surface of the Crystal Containing a Stacking Fault. //Abstracts' Book of International Conference on X-Rays and Related Techniques in Research and Industry (ICXRI) 2002, Shah Alam, Selangor (Malaysia), p. 17, 30 th-31 st October 2002. //Malaysian Journal of Science, 2002, v.21A (Special Issue), pp. 31-40.         2003       [45]. P.H. Bezirganyan (Jr.), H.P. Bezirganyan, S.E. Bezirganyan, H.H. Bezirganyan (Jr.) and K.O. Hovnanyan. Grazing-Angle Incidence X-ray Diffraction by Si1-a(x)Gea(x) Thin Layer if the Composition Coefficient a(x) is Varying Harmonically Along the Flat Layer Surface. //Spectrochim. Acta, Part B, 2003, v.58 (4, Special Issue), pp. 745-757.         [46]. S.E. Bezirganyan, H.H. Bezirganyan (Jr.), H.P. Bezirganyan and P.H. Bezirganyan (Jr.). Determination of Space Shift of Si/SiGe/Si Heterojunction's Cap Layer by Grazing-Angle Incidence X-ray Backdiffraction Technique. //Abstracts of Materials Research Society (MRS) 2003 Spring Meeting, San Francisco, CA, G3.1, pp.151,152, 21 st-25 th April 2003. //In Integration of Heterogeneous Thin-Film Materials and Devices, edited by Atwater H.A., Current M.I., Levy M., Sands T.D., Mater. Res. Soc. Symp. Proc., v.768, San Francisco, CA, 2003, pp. 45-50.        [47]. H.P. Bezirganyan, H.H. Bezirganyan (Jr.), S.E. Bezirganyan and P.H. Bezirganyan (Jr.). Study of Crystal-Amorphous State Transitional Layer by Grazing-Angle Incidence X-ray Backdiffraction Technique. //Proc. on 11th Conference of Armenian Electron Microscopy Society (AEMS), Yerevan (Armenia), pp. 40-45, 20th, 21st November 2003.       2004       [48]. S.E. Bezirganyan, H.H. Bezirganyan (Jr.), H.P. Bezirganyan and P.H. Bezirganyan (Jr.). Quantitative Analysis of Average Crystallization Rate by Grazing-Angle Incidence X-ray Backdiffraction Technique. //Abstracts of Materials Research Society (MRS) 2004 Spring Meeting, San Francisco, CA, A9.19, p.31, 12 th-16 th April 2004 (Abstracts of MRS Symposium A: 5,18MB).       [49]. H.P. Bezirganyan, H.H. Bezirganyan (Jr.), S.E. Bezirganyan and P.H. Bezirganyan (Jr.). Investigation of Si/SiGe/Si Heterojunction with Relaxed Layers by Grazing-Angle Incidence X-ray Backdiffraction Technique. //Book of Abstracts of European X-Ray Spectrometry Conference (EXRS 2004), Alghero, Sardinia (Italy), 22A, p.26, 6 th-11 th June 2004  (Scientific Program 155KB).       [50]. H.P. Bezirganyan, H.H. Bezirganyan (Jr.), S.E. Bezirganyan and P.H. Bezirganyan (Jr.). Specular beam suppression and enhancement phenomena in the case of grazing-angle incidence X-rays backdiffraction by the crystal with stacking fault. //Opt. Commun., 2004, v.238 (Issues 1-3), pp. 13-28.         [51]. H.P. Bezirganyan, H.H. Bezirganyan (Jr.), S.E. Bezirganyan and P.H. Bezirganyan (Jr.). Ultrahigh-Density Semiconductor Data Storage Media Useful for Data Readout by X-ray Microbeam. //Book of Abstracts of III International Optical Congress “Optics - XXI Century” & III International Conference “Basic Problems of Optics”, Topical Meeting on Optoinformatics, Saint-Petersburg (Russia), p.48, 18th-21st October 2004.       [52]. S.E. Bezirganyan, H.H. Bezirganyan (Jr.), H.P. Bezirganyan and P.H. Bezirganyan (Jr.). Fine Determination of the Lattice Longitudinal Shift Between Layers of the Strain-Compensated Si/SiGeC/Si HBT. //Abstracts of Materials Research Society (MRS) 2004 Fall Meeting, Boston, MA (USA), B9.24, p.59, 29th November - 3rd December 2004 (Abstracts of MRS Symposium B: 4,65MB).       2005       [53]. S.E. Bezirganyan, H.H. Bezirganyan (Jr.), H.P. Bezirganyan and P.H. Bezirganyan (Jr.). Space Shift between Relaxed Si and Strain-compensated SiGeC Epitaxial Layers. //Book of Abstracts of XX Congress of the International Union of Crystallography (IUCr), Florence (Italy), P.15.11.1, p. C435, 23rd-31st August 2005 . //Acta Cryst. A61, p. C435, 2005 (see Abstract 108 KB).       [54]. H.P. Bezirganyan, H.H. Bezirganyan (Jr.), S.E. Bezirganyan and P.H. Bezirganyan (Jr.). Detection of weak X-ray Waves Scattered by the Crystal Subsurface Inclusions. //Book of Abstracts of XX Congress of the International Union of Crystallography (IUCr), Florence (Italy), P.17.04.2, p. C448, 23rd-31st August 2005 . //Acta Cryst. A61, p. C448, 2005 (see Abstract 128 KB).       [55]. H.P. Bezirganyan, H.H. Bezirganyan (Jr.), S.E. Bezirganyan, P.H. Bezirganyan (Jr.) and Y.G. Mossikyan. An ultrahigh-density digital data read-out method based on grazing-angle incidence x-ray backscattering diffraction. //J. Opt. A: Pure Appl. Opt., 2005, v.7 (Issue 10), pp. 604-612.       [56]. H.P. Bezirganyan, H.H. Bezirganyan (Jr.), S.E. Bezirganyan and P.H. Bezirganyan (Jr.). Data Readout by Sensing Changes in X-ray Reflectivity along Smooth Surface of the Ultrahigh-Density Digital Data Storage Media. //Book of Abstracts of 18th International Conference on X-Ray Optics and Microanalysis (XVIII ICXOM), Frascati, Rome (Italy), p.168, 25th-30th September 2005.       [57]. H.P. Bezirganyan, H.H. Bezirganyan (Jr.), S.E. Bezirganyan and P.H. Bezirganyan (Jr.). Fluorescence radiation yield from the cup layer of bicrystal in configuration of grazing-angle incidence X-ray backscattering diffraction. //Book of Abstracts of the European Workshop on Quantitative Analysis in X-ray Fluorescence Spectrometry (XRF), Ghent (Belgium), p.25, 13th-14th October 2005.       2006       [58]. S.E. Bezirganyan, H.P. Bezirganyan, H.H. Bezirganyan (Jr.) and P.H. Bezirganyan (Jr.). High-resolution Investigation of Crystal-amorphous Interfaces. Symposium R: "Advances in Transparent Electronics: from Materials to Devices". //Book of Abstracts of European Materials Research Society Spring Meeting (E-MRS IUMRS ICEM 2006), Nice (France), R PIV 41, 29th May-02nd June 2006.       [59]. H.P. Bezirganyan, S.E. Bezirganyan, H.H. Bezirganyan (Jr.) and P.H. Bezirganyan (Jr.). Digital Data Read-out by Glancing Angle Incidence X-ray Reflection. //Book of Abstracts of 12th European Conference on X-Ray Spectrometry (EXRS 2006), Paris (France), P11-1, p.257, 19th-23rd June 2006.       [60]. H.P. Bezirganyan, S.E. Bezirganyan, H.H. Bezirganyan (Jr.) and P.H. Bezirganyan (Jr.). Coplanar Grazing-angle Incidence X-ray Backscattering Diffraction in Conditions of Specular Beam Suppression by a Crystal with the Radiation-damaged Layer. //Book of Abstracts of XVI International Synchrotron Radiation Conference (SR-2006), Budker Institute of Nuclear Physics, Novosibirsk (Russia), p.60, 10th-15th July 2006.       [61]. S.E. Bezirganyan, H.P. Bezirganyan, H.H. Bezirganyan (Jr.) and P.H. Bezirganyan (Jr.). X-rays Guided by Linearly Graded SiGe Layer Grown on Relaxed SiGe/Si Structure. //Abstracts of the 23rd European Crystallographic Meeting (ECM23), Leuven (Belgium), p.s94, 6th-11th August 2006. //Acta Cryst. A62, p. s94, 2006 (see Abstract 43 KB).       [62]. H.P. Bezirganyan, S.E. Bezirganyan, H.H. Bezirganyan (Jr.) and P.H. Bezirganyan (Jr.). Specular Beam Suppression in case of Grazing-angle Incidence X-ray Backscattering Diffraction by the Single Crystal Wafer Covered with a Thin Non-Diffracting Layer. //Book of Abstracts of the 8th Biennial Conference on High-Resolution X-Ray Diffraction and Imaging (XTOP 2006), Baden-Baden / Karlsruhe (Germany), p.74, 17th-23rd September 2006.       2007       [63]. H.P. Bezirganyan, S.E. Bezirganyan, H.H. Bezirganyan (Jr.) and P.H. Bezirganyan (Jr.). Two-dimensional ultrahigh-density x-ray optical memory. //J. Nanosci. Nanotechnol., 2007, v.7 (Issue 1), pp. 306-315.       [64]. H.P. Bezirganyan, S.E. Bezirganyan, H.H. Bezirganyan (Jr.) and P.H. Bezirganyan (Jr.). Two-layer ultrahigh-density x-ray optical memory. //Proc. of the NATO Advances Research Workshop (NATO ARW 2006) on Brilliant Light Facilities and Research in Life and Material Sciences, held at CANDLE in Yerevan (Armenia), 17th-21st July 2006, in Subseries: NATO Security through Science Series B: Physics and Biophysics, edited by Tsakanov V.M. and Wiedemann H., Springer, Netherlands, 2007, pp. 495-498.       [65]. H.P. Bezirganyan, S.E. Bezirganyan, P.H. Bezirganyan (Jr.) and H.H. Bezirganyan (Jr.). Digital Data Readout from X-ray Optical Memory Covered with Thin Cap Layer. //Abstracts of 23rd Optical Data Storage Topical Meeting (ODS 2007) held in the Benson Hotel, Portland, Oregon (USA), p. MD7, 20th-23rd May 2007.       [66]. H.P. Bezirganyan, S.E. Bezirganyan, P.H. Bezirganyan (Jr.) and H.H. Bezirganyan (Jr.). Wave field Enhancement during Grazing Incidence X-ray Backscattering Diffraction. //Abstracts of the 24th European Crystallographic Meeting (ECM24), Marrakech (Morocco), MS37 P01, p. s253, 22nd-27th August 2007. //Acta Cryst. A63, p. s253, 2007 (see Abstract 219 KB).       [67]. S.E. Bezirganyan, H.P. Bezirganyan, P.H. Bezirganyan (Jr.) and H.H. Bezirganyan (Jr.). Optimal Thickness of Non-diffracting Subsurface Mirrors of X-Ray Optical Memory. //Abstracts of the 24th European Crystallographic Meeting (ECM24), Marrakech (Morocco), MS37 P02, p. s253, 22nd-27th August 2007. //Acta Cryst. A63, p. s253, 2007 (see Abstract 219 KB).       [68]. S.E. Bezirganyan, H.P. Bezirganyan, P.H. Bezirganyan (Jr.) and H.H. Bezirganyan (Jr.). Optimal Thickness of Non-diffracting Subsurface Mirrors of X-Ray Optical Memory. //Abstracts of the 5th IEEE East-West Design & Test Symposium (EWDTS 2007) held at Congress Hotel in Yerevan (Armenia), P22, 7th-10th September 2007 (see the Symposium Program 593 KB).       [69]. H.P. Bezirganyan and S.E. Bezirganyan. X-ray optical memory (X-ROM). //Transactions of anniversary scientific session: 50th Anniversary of the Chair of Solid State Physics of Yerevan State University (University Press: Yerevan, Armenia), 2007, pp. 15-20.       2008       [70]. H.P. Bezirganyan, S.E. Bezirganyan, P.H. Bezirganyan (Jr.) and H.H. Bezirganyan (Jr.). Amplification of specular x-rays caused by grazing-angle incidence backscattering diffraction in epitaxial bi-layer grown on relaxed crystalline substrate. //J. Opt. A: Pure Appl. Opt., 2008, v.10, 025002, 9 pp. (Paper is dedicated to Professor Dr. Petros H. Bezirganyan on the occasion of his 90th birthday).       [71]. H.P. Bezirganyan, S.E. Bezirganyan, P.H. Bezirganyan (Jr.) and H.H. Bezirganyan (Jr.). An application of the grazing-angle incidence hard x-ray optical nanoscope in ultra-high density digital data read-out device. //Proc. of the SPIE Symposium on Optical Engineering + Applications, held in San Diego, CA (USA), 10th-14th August 2008, in: Advances in X-Ray/EUV Optics and Components III (OP322), edited by Shunji Goto, Ali M. Khounsary, Christian Morawe, SPIE, Bellingham, WA, USA, 2008, v.7077, 70770P, 7 pp.       [72]. H.P. Bezirganyan, S.E. Bezirganyan, P.H. Bezirganyan (Jr.) and H.H. Bezirganyan (Jr.). Grazing-angle incidence hard X-ray nanoscope. //Book of Abstracts of XXI Congress of the International Union of Crystallography (IUCr), Osaka (Japan), pp. C182-183, 23rd-31st August 2008. //Acta Cryst. A64, P01.07.39, pp. C182-183, 2008 (see Abstract 432 KB).       [73]. S.E. Bezirganyan and G.R. Ulikhanyan. Multiple scattering of light by collagen nanofibres in biological tissues. //Book of Abstracts of XXI Congress of the International Union of Crystallography (IUCr), Osaka (Japan), P13.03.05, p. C563, 23rd-31st August 2008. //Acta Cryst. A64, p. C563, 2008 (see Abstract 212 KB).       2009       [74]. H.P. Bezirganyan and S.E. Bezirganyan. Registration of structural disorder profile of crystalline material with particle induced damaged domains via grazing-angle incidence hard x-ray nanoscope. //Abstracts of the 58th Annual Denver X-ray Conference (DXC) held 27th-31st July 2009, Colorado Springs, Colorado (USA), p. D-109, 2009 (see Abstract 225 KB).       [75]. H.P. Bezirganyan, S.E. Bezirganyan, P.H. Bezirganyan (Jr.) and H.H. Bezirganyan (Jr.). Evaluation of data storage layer thickness best fitted for digital data readout procedure from hard x-ray optical memory. //Proc. of the SPIE Symposium on Optical Engineering + Applications, held in San Diego, CA (USA), 2nd-6th August 2009, in: Advances in X-Ray/EUV Optics and Components IV (OP417), edited by Shunji Goto, Ali M. Khounsary, Christian Morawe, SPIE, Bellingham, WA, USA, 2009, v.7448, 74480T, 10 pp.       Back to Main Page